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Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

Simsova, J, Gemperle, R, Kambersky, R, Cernansky, M, Gerber, R, Papakonstantinou, P and Atkinson, R (1995) Thickness dependence of domain period in BafoxTiyFe12_x_yO 9. Journal of Magnetism and Magnetic Materials, 148 . pp. 247-248. [Journal article]

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URL: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJJ-453C8MD-3S&_user=126978&_coverDate=07%2F01%2F1995&_rdoc=1&_fmt=high&_orig=search&_origin=search&_sort=d&_docanchor=&view=c&_acct=C000010438&_version=1&_urlVersion=0&_userid=126978&md5=fd1d682a

DOI: 10.1016/0304-8853(95)00224-3


The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

Item Type:Journal article
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:17061
Deposited By: Professor Pagona Papakonstantinou
Deposited On:11 Feb 2011 10:13
Last Modified:17 Oct 2017 15:56

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