Lemoine, P and McLaughlin, JAD (1999) Nanomechanical measurements on polymers using contact mode atomic force microscopy. THIN SOLID FILMS, 339 (1-2). pp. 258-264. [Journal article]
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Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
|Item Type:||Journal article|
|Keywords:||atomic force microscopy; hardness; polymers; surface morphology|
|Faculties and Schools:||Faculty of Computing & Engineering|
Faculty of Computing & Engineering > School of Engineering
|Research Institutes and Groups:||Engineering Research Institute|
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
|Deposited By:||Mrs Ann Blair|
|Deposited On:||19 Jul 2011 07:57|
|Last Modified:||19 Jul 2011 07:57|
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