Lemoine, P and McLaughlin, JAD (1997) Surface characterisation of ultrathin diamond-like carbon coatings by low voltage SEM/EDX analysis. In: ELECTRON MICROSCOPY AND ANALYSIS 1997. IOP PUBLISHING LTD. (153) 4 pp. [Conference contribution]
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The intensity of EDX peaks fi-om substrate elements is used to measure the thickness of ultrathin DLC films. It also provide an electron energy loss estimate useful for optimising secondary electron images.
|Item Type:||Conference contribution (Paper)|
|Faculties and Schools:||Faculty of Computing & Engineering|
Faculty of Computing & Engineering > School of Engineering
|Research Institutes and Groups:||Engineering Research Institute|
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
|Deposited By:||Mrs Ann Blair|
|Deposited On:||19 Jul 2011 08:02|
|Last Modified:||19 Jul 2011 08:02|
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