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Thickness dependent electronic structure of ultra-thin tetrahedral amorphous carbon (ta-C) films

Soin, N, Roy, SS, Ray, SC, Lemoine, P, Rahman, MDA, Maguire, PD, Mitra, SK and McLaughlin, JAD (2012) Thickness dependent electronic structure of ultra-thin tetrahedral amorphous carbon (ta-C) films. Thin Solid Films, 520 (7). p. 2909. [Journal article]

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URL: http://dx.doi.org/10.1016/j.tsf.2011.12.039

DOI: doi:10.1016/j.tsf.2011.12.039


Microstructural properties of ultrathin (1-10 nm) tetrahedral amorphous carbon (ta-C) films are investigated by Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy, X-ray Photoelectron Spectroscopy, Raman spectroscopy and Atomic Force Microscopy (AFM). The CK-edge NEXAFS spectra of 1 nm ta-C films provided evidence of surface defects (C - H bonds) which rapidly diminish with increasing film thickness. A critical thickness for stabilization of largely sp 3 matrix structure distorted by sp 2 sites is observed via the change of ?*C*C peak behavior. Meanwhile, an increase in the film thickness promotes an enhancement in sp 3 content, the film roughness remains nearly constant as probed by spectroscopic techniques and AFM, respectively. The effect of thickness on local bonding states of ultrathin ta-C films proves to be the limiting factor for their potential use in magnetic and optical storage devices. © 2011 Elsevier B.V. All rights reserved.

Item Type:Journal article
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:28358
Deposited By: Mrs Ann Blair
Deposited On:14 Jan 2014 07:01
Last Modified:14 Jan 2014 07:01

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