Mathur, A, Tweedie, M, Roy, SS, Maguire, PD and McLaughlin, JAD (2009) Electrical and Raman Spectroscopic Studies of Vertically Aligned Multi-Walled Carbon Nanotubes. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 9 (7, Sp. Iss. SI). pp. 4392-4396. [Journal article]
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Microwave plasma enhanced chemical vapour deposition (MPECVD) was used for the production of carbon nanotubes. Vertically aligned multi-walled carbon nanotubes (MWCNTs) were grown on silicon substrates coated with cobalt thin films of thickness ranging from 0.5 nm to 3 nm. Prior to the nanotube growth the catalyst were treated with N-2 plasma for 5-10 minutes that break the films into small nanoparticles which favour the growth of nanotubes. The CNTs were grown at a substrate temperature of 700 degrees C for 5, 10 and 15 minutes. The height of the CNT films ranging from 10 mu m-30 mu m indicating that the initial growth rate of the CNTs are very high at a rate of approximately 100 nm/sec. Electrical resistivity of the above samples was evaluated from I-V measurements. The activation energy (E-a) was also calculated from the temperature dependent studies and it was found that the E-a lies in the range of 15-35 meV. Raman spectroscopy was used to identify the quality of the nanotubes.
|Item Type:||Journal article|
|Keywords:||Carbon Nanotubes; Electrical Properties; Raman Spectroscopy|
|Faculties and Schools:||Faculty of Computing & Engineering|
Faculty of Computing & Engineering > School of Engineering
|Research Institutes and Groups:||Engineering Research Institute|
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
|Deposited By:||Mrs Ann Blair|
|Deposited On:||28 Oct 2009 13:30|
|Last Modified:||15 Jun 2011 09:52|
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