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Electrical and Raman Spectroscopic Studies of Vertically Aligned Multi-Walled Carbon Nanotubes

Mathur, A, Tweedie, M, Roy, SS, Maguire, PD and McLaughlin, JAD (2009) Electrical and Raman Spectroscopic Studies of Vertically Aligned Multi-Walled Carbon Nanotubes. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 9 (7, Sp.). pp. 4392-4396. [Journal article]

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URL: http://www.ingentaconnect.com/content/asp/jnn/2009/00000009/00000007/art00066?token=004b194e2ed5ca03b7e2a46762c476521487034704549562f42673f582f47e3c775723f9839

DOI: 10.1166/jnn.2009.M66


Microwave plasma enhanced chemical vapour deposition (MPECVD) was used for the production of carbon nanotubes. Vertically aligned multi-walled carbon nanotubes (MWCNTs) were grown on silicon substrates coated with cobalt thin films of thickness ranging from 0.5 nm to 3 nm. Prior to the nanotube growth the catalyst were treated with N-2 plasma for 5-10 minutes that break the films into small nanoparticles which favour the growth of nanotubes. The CNTs were grown at a substrate temperature of 700 degrees C for 5, 10 and 15 minutes. The height of the CNT films ranging from 10 mu m-30 mu m indicating that the initial growth rate of the CNTs are very high at a rate of approximately 100 nm/sec. Electrical resistivity of the above samples was evaluated from I-V measurements. The activation energy (E-a) was also calculated from the temperature dependent studies and it was found that the E-a lies in the range of 15-35 meV. Raman spectroscopy was used to identify the quality of the nanotubes.

Item Type:Journal article
Keywords:Carbon Nanotubes; Electrical Properties; Raman Spectroscopy
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:351
Deposited By: Mrs Ann Blair
Deposited On:28 Oct 2009 13:30
Last Modified:15 Jun 2011 09:52

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