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Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing

Malyuskin, Oleksandr and Fusco, Vincent (2017) Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing. Sensing and Imaging, 18 . [Journal article]

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DOI: 10.1007/s11220-017-0157-8

Abstract

A super-resolution defect characterization technique based on near-field resonance reflectometry and cross-correlation image processing is proposed in this paper. The hardware part of the microwave imaging system employs a novel loaded aperture (LA) probe which allows collimation of the electromagnetic field to approximately λ/10 focal spot(s) at λ/100 to λ/10 stand-off distances, λ being the wavelength of radiation in free space. The characteristic raw image spatial resolution of the LA probe is around λ/10 in one dimension with amplitude contrast/sensitivity exceeding 10–20 dB. It is demonstrated that the LA spatial resolution can be at least two times enhanced in two dimensions in the image plane using basic cross-correlation image processing while retaining a very high level of amplitude contrast of at least 10 dB.

Item Type:Journal article
Keywords:Near-field reflectometryMicrowave high-resolution imagingApertureElectromagnetic field enhancementMeasurementImageCorrelation
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:37178
Deposited By: Dr Oleksandr Malyuskin
Deposited On:26 Apr 2017 08:26
Last Modified:17 Oct 2017 16:28

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