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High-Resolution Microwave Near-Field Surface Imaging Using Resonance Probes

Malyuskin, Oleksandr and Fusco, Vincent (2016) High-Resolution Microwave Near-Field Surface Imaging Using Resonance Probes. IEEE Transactions on Instrumentation and Measurement, 65 (1). pp. 189-200. [Journal article]

[img] Text - Accepted Version

URL: http://ieeexplore.ieee.org/document/7274708/

DOI: 10.1109/TIM.2015.2476277


A novel microwave high-resolution near-field imaging technique is proposed and experimentally evaluated in reflectometry imaging scenarios involving planar metal-dielectric structures. Two types of resonance near field probes-a small helix antenna and a loaded subwavelength slot aperture are studied in this paper. These probes enable very tight spatial field localization with the full width at half maximum around one tenth of a wavelength, λ, at λ/100-λ/10 standoff distance. Importantly, the proposed probes permit resonance electromagnetic coupling to dielectric or printed conductive patterns, which leads to the possibility of very high raw image resolution with imaged feature-to-background contrast greater than 10-dB amplitude and 50° phase. In addition, high-resolution characterization of target geometries based on the cross correlation image processing technique is proposed and assessed using experimental data. It is shown that printed elements features with subwavelength size ~λ/15 or smaller can be characterized with at least 10-dB resolution contrast.

Item Type:Journal article
Keywords:Probes, Helical antennas, Microwave imaging, Dielectrics, Microwave antennas, Spatial resolution
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:37238
Deposited By: Dr Oleksandr Malyuskin
Deposited On:31 Mar 2017 09:39
Last Modified:07 Sep 2017 09:02

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